Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument

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After-sales Service: Online Support/Service at Customer Site
Application: Machinery, Electronics
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Registered Capital
2000000 RMB
Plant Area
1001~2000 square meters
  • Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
  • Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
  • Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
  • Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
  • Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
  • Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
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  • Overview
  • Company Profile
  • Product Description
  • Our Advantages
  • Product Parameters
  • Certifications
  • Packaging & Shipping
Overview

Basic Info.

Model NO.
W3
Certification
GS, CE, RoHS, ISO
Condition
New
Performance Classification
Economical
Transport Package
Wooden Crates/Sea Packaging
Specification
presently inquiring
Trademark
CHOTEST
Origin
China
HS Code
9031499090
Production Capacity
2000PCS/Year

Packaging & Delivery

Package Size
76.00cm * 122.00cm * 167.00cm
Package Gross Weight
600.000kg

Product Description

Company Profile

Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring InstrumentChotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Product Description

CHOTEST SuperView W1, Highly accurate and easy-to-use optical 3D surface profile measuring instrument
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Product introduction
White light interferometric micro- and nano-dimensional morphology measurements at the touch of a button
 
Our Advantages
Application Fields

It can be widely used in the measurement and analysis of surface roughness, geometric profile and other parameters of precision components in semiconductor, 3C electronics, ultra-precision machining, optical machining, micro and nano-materials, micro-electromechanical and other industries.

Semiconductor
Thin film, coated film, wafer IC
Roughness, microcontour

3C electronics
Sapphire screen, cell phone screen ink screen
Roughness, flatness step height

Optical
Precision molds, optical lenses
Roughness, flatness radius of curvature, profile

Micro and Nano Materials
PET substrate coating surface
Coating roughness film layer, thickness

Tribology

CSM Friction
Wear components
Roughness, contour size area/volume parameters

 
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Measures and analyzes surface features such as flatness, roughness, corrugation, surface contour, surface defects, wear, corrosion, pore clearance, step height, bending deformation, and machining of various products, components, and material surfaces.
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Unique 3D reconstruction algorithm automatically filters out sample surface noise, and the measurement accuracy can reach sub-nanometer level with the hardware system.
interference objective
Lenses with different magnifications, adapted to various surface types from ultra-smooth to rough.
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Vacuum table
A customized vacuum table for semiconductor wafers ensures that the sample is not affected by weak air currents during the measurement process.
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring InstrumentDual-channel air-bearing vibration isolation system
Dual-channel air-bearing vibration isolation system with external air source and direct inflation of the pressurization device can effectively isolate the vibration noise transmitted from the ground.

Acoustic vibration isolation protection
The instrument shell and internal motion mechanism adopt separate design, which can effectively isolate the transmission of acoustic vibration.

Horizontal adjustment device
Tilt adjustment knob to adjust the stripe width and improve the reconstruction accuracy of 3D image.

Convenient Joystick
Ergonomically designed joystick with integrated automatic control of XYZ displacement and speed, light source brightness, and emergency stop button.


Xtreme Vision 3D Measurement and Analysis Software
All-in-one software, measurement and analysis in the same interface, pre-configured analysis parameters, the software automatically statistics measurement data to achieve rapid batch measurement function.
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring InstrumentOne-key analysis, multi-file analysis: Self-made analysis templates, can be one-key analysis of a single file, can also be one-key analysis of a batch of files.

Automatic multi-area measurement: Automatic displacement and focusing to complete the measurement and analysis of multiple areas of the surface.

Localized Measurement: Select any area feature in the field of view for measurement.

Splice Measurement: Determine the starting point and end point, automatically focus and find stripes to complete the large area splice measurement.

Pre-configured parameters: Pre-configure surface treatment, analysis tools and other parameters, one-click measurement, direct access to the results.

2D/3D view window, can extract the profile at any position, and can extract the profile at multiple positions at one time.

Current analysis window, used to display the curves and data of the current analysis tool, synchronized with the change of the profile position in the view window.

Real-time video window for comparing the finished scan with the 3D view.


Optical Specification Sheet
Objective Magnification 2.5x 5x 10x 20x 50x 100x
Numerical Aperture 0.075 0.13 0.3 0.4 0.55 0.7
Optical Resolution @550nm (μm) 3.7 2.1 0.92 0.69 0.5 0.4
Depth of Focus (μm) 48.6 16.2 3.04 1.71 0.9 0.56
Working Distance (mm) 10.3 9.3 7.4 4.7 3.4 2.0
Field of View H×V (mm) 0.5x for Imaging System 1024x1024: 3.84×3.84 0.5x for Imaging System 1024x1024: 1.92×1.92 0.5x for Imaging System 1024x1024: 0.96×0.96 0.5x for Imaging System 1024x1024: 0.48×0.48 0.5x for Imaging System 1024x1024: 0.192×0.192 0.5x for Imaging System 1024x1024: 0.096×0.096
  0.75x for Imaging System 1024x1024: 2.56×2.56 0.75x for Imaging System 1024x1024: 1.28×1.28 0.75x for Imaging System 1024x1024: 0.64×0.64 0.75x for Imaging System 1024x1024: 0.32×0.32 0.75x for Imaging System 1024x1024: 0.128×0.128 0.75x for Imaging System 1024x1024: 0.064×0.064
  1x for Imaging System 1024x1024: 1.92×1.92 1x for Imaging System 1024x1024: 0.96×0.96 1x for Imaging System 1024x1024: 0.48×0.48 1x for Imaging System 1024x1024: 0.24×0.24 1x for Imaging System 1024x1024: 0.096×0.096 1x for Imaging System 1024x1024: 0.048×0.048
 
Product Parameters
 
Instrument Model SuperView W3
Instrument Dimensions (1000×900×1500)mm
Weight of Instrument Main Unit < 500 kg
Light Source White Light LED
Imaging System 1024×1024
Interferometric Objective 10×, (2.5×, 5×, 20×, 50×, 100×)
Optical ZOOM 0.5×, (0.75×, 1×, 0.375×)
Standard Field of View 0.98×0.98mm
Turret 5 - hole Electric
XY Displacement Platform - Size 450×450mm
XY Displacement Platform - Movement Range 300×300mm
XY Displacement Platform - Load 10kg
XY Displacement Platform - Control Method Electric
XY Displacement Platform - Horizontal Adjustment ±6°, Electric
Z - Axis Focus - Stroke 100mm
Z - Axis Focus - Control Method Electric
Z - Direction Scanning Range 10mm
Shape Repeatability 0.1nm
Roughness RMS Repeatability 0.005nm
Step Measurement - Accuracy 0.3%
Step Measurement - Repeatability 0.08% 1σ
Environmental Requirements  
1. Operating Environment No strong magnetic field, no corrosive gas
2. Working Temperature 15°C - 30°C, temperature gradient < 2°C/60 minutes
3. Relative Humidity 5% - 95%RH, no condensation
4. Environmental Vibration VC - C or better
5. Vibration - Isolation Air Source 0.8Mpa pressurized clean air source, oil - free, water - free, air pipe diameter 6mm (optional)
6. Power Supply Capacity 330W
Other Requirements  
1. Light Source Should not remain at high brightness for a long time
2. During Measurement Do not directly shake the instrument table by hand
Certifications

Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Packaging & Shipping

Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring InstrumentChotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument
Chotest Superview W3, Highly Accurate and Easy-to-Use Optical 3D Surface Profile Measuring Instrument

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